Scientists crack the code on why organic transistors behave unpredictably
Researchers have developed the first reliable model to predict manufacturing defects in organic transistors—a breakthrough that could accelerate the commercialization of flexible electronics. The findings, validated across 80 real devices, address a critical barrier to scaling up production of bendable displays and wearable chips.
Originaltitel: Modeling of Drain Current Mismatch in OrganicThin-Film Transistors
<p>In this paper, we present a consistent model to analyzethe drain current mismatch of organic thin-film transistors.The model takes charge fluctuations and edge effects into account,to predict the fluctuations of drain currents. A Poisson distributionfor the number of charge carriers is assumed to represent therandom distribution of charge carriers in the channel. The edge effectsdue to geometric variations in fabrication processes are interpretedin terms of the fluctuations of channel length and width. Thesimulation results are corroborated by experimental results takenfrom over 80 organic transistors on a flexible plastic substrate.</p>